Dark-field microscopy

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Dark-field microscopy (also called dark-ground microscopy) describes

the beam) is generally dark.

In optical microscopes a darkfield condenser lens must be used, which directs a cone of light away from the objective lens. To maximize the scattered light-gathering power of the objective lens, oil immersion is used and the numerical aperture (NA) of the objective lens must be less than 1.0. Objective lenses with a higher NA can be used but only if they have an adjustable diaphragm, which reduces the NA. Often these objective lenses have a NA that is variable from 0.7 to 1.25.^[1]

Light microscopy applications

In

. It works by illuminating the sample with light that will not be collected by the objective lens and thus will not form part of the image. This produces the classic appearance of a dark, almost black, background with bright objects on it.

The light's path

The steps are illustrated in the figure where an inverted microscope is used.

1. Light enters the microscope for illumination of the sample.
2. A specially sized disc, the patch stop (see figure), blocks some light from the light source, leaving an outer ring of illumination. A wide phase annulus can also be reasonably substituted at low magnification.
3. The
   condenser lens
   focuses the light towards the sample.
4. The light enters the sample. Most is directly transmitted, while some is scattered from the sample.
5. The scattered light enters the objective lens, while the directly transmitted light simply misses the lens and is not collected due to a direct-illumination block (see figure).
6. Only the scattered light goes on to produce the image, while the directly transmitted light is omitted.

Advantages and disadvantages

Dark-field microscopy is a very simple yet effective technique and well suited for uses involving live and

biological samples, such as a smear from a tissue culture or individual, water-borne, single-celled organisms. Considering the simplicity of the setup, the quality of images obtained from this technique is impressive.

One limitation of dark-field microscopy is the low light levels seen in the final image. This means that the sample must be very strongly illuminated, which can cause damage to the sample.

Dark-field microscopy techniques are almost entirely free of halo or relief-style artifacts typical of DIC and phase-contrast imaging. This comes at the expense of sensitivity to phase information.

The interpretation of dark-field images must be done with great care, as common dark features of bright-field microscopy images may be invisible, and vice versa. In general the dark-field image lacks the low spatial frequencies associated with the bright-field image, making the image a high-passed version of the underlying structure.

While the dark-field image may first appear to be a negative of the bright-field image, different effects are visible in each. In bright-field microscopy, features are visible where either a shadow is cast on the surface by the incident light or a part of the surface is less reflective, possibly by the presence of pits or scratches. Raised features that are too smooth to cast shadows will not appear in bright-field images, but the light that reflects off the sides of the feature will be visible in the dark-field images.

• Comparison of transillumination techniques used to generate contrast in a sample of tissue paper (1.559 μm/pixel when viewed at full resolution)
• 
  Dark-field illumination, sample contrast comes from light

  scattered

  by the sample
• 
  Bright-field illumination, sample contrast comes from attenuation of light in the sample
• 
  Cross-polarized light illumination, sample contrast comes from rotation of polarized light through the sample
• 
  interference

  of different path lengths of light through the sample

Use in computing

Dark-field microscopy has recently been applied in computer mouse pointing devices to allow the mouse to work on transparent glass by imaging microscopic flaws and dust on the glass's surface.

Dark-field microscopy combined with hyperspectral imaging

When coupled to

Transmission electron microscope applications

Dark-field studies in transmission electron microscopy play a powerful role in the study of crystals and crystal defects, as well as in the imaging of individual atoms.

Conventional dark-field imaging

Briefly, imaging^[3] involves tilting the incident illumination until a diffracted, rather than the incident, beam passes through a small objective aperture in the objective lens back focal plane. Dark-field images, under these conditions, allow one to map the diffracted intensity coming from a single collection of diffracting planes as a function of projected position on the specimen and as a function of specimen tilt.

In single-crystal specimens, single-reflection dark-field images of a specimen tilted just off the

allow one to "light up" only those lattice defects, like dislocations or precipitates, that bend a single set of lattice planes in their neighborhood. Analysis of intensities in such images may then be used to estimate the amount of that bending. In polycrystalline specimens, on the other hand, dark-field images serve to light up only that subset of crystals that are Bragg-reflecting at a given orientation.

Animation: dark-field imaging of crystals

This animation illustrates movement of an aperture (centered in the orange figure at left) over the power spectrum (a digital substitute for the back focal-plane's optical diffraction pattern) shown with the DC peak (or unscattered beam) below center. Only nanocrystals with projected periodicities that diffract into the aperture light up in the dark-field image at right. The aperture is moving by 1.25° increments around the ring associated with diffraction from gold 2.3 Å (111) lattice spacings.

Weak-beam imaging

Weak-beam imaging involves optics similar to conventional dark-field, but uses a diffracted beam harmonic rather than the diffracted beam itself. In this way, much higher resolution of strained regions around defects can be obtained.

Low- and high-angle annular dark-field imaging

, this is sometimes called Z-contrast imaging because of the enhanced scattering from high-atomic-number atoms.

Digital dark-field analysis

This a mathematical technique intermediate between direct and reciprocal (Fourier-transform) space for exploring images with well-defined periodicities, like electron microscope lattice-fringe images. As with analog dark-field imaging in a transmission electron microscope, it allows one to "light up" those objects in the field of view where periodicities of interest reside. Unlike analog dark-field imaging it may also allow one to map the Fourier-phase of periodicities, and hence phase gradients, which provide quantitative information on vector lattice strain.

See also

• Annular dark-field imaging
• Light field microscopy
• Wavelets

Footnotes

External links

Library resources about
Dark-field microscopy

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• Resources in your library
• Resources in other libraries

Wikimedia Commons has media related to Dark-field microscopy.

• Nikon - Stereomicroscopy > Darkfield Illumination
• Molecular Expressions
• Darkfield Illumination Primer
• Gage SH. 1920. Modern dark-field microscopy and the history of its development. Transactions of the American Microscopical Society 39(2):95–141.
• Dark field and phase contrast microscopes (Université Paris Sud)