Colin Sheppard

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Colin J. R. Sheppard
Italian Institute of Technology
ThesisA reflection scanning electron diffractometer and its application to the oxidation of metals (1973)
Doctoral advisorCharles Oatley

Colin James Richard Sheppard, usually cited as C. J. R. Sheppard, is senior scientist at the

superresolution
, beam propagation, and pulse propagation.

Education

Sheppard completed an

Physical Sciences from the University of Oxford
in 1986.

Academic career

Sheppard is currently senior scientist at the

Diagnostic Radiology (School of Medicine). He was SMART (Singapore/MIT Alliance for Research & Technology)[4] Faculty Fellow, and Adjunct
Research Staff at SERI (Singapore Eye Research Institute).

He held a Science & Engineering Research Council Advanced Fellowship (1974–6) and was

Oxford University (1979–89). He was Junior Research Fellow of St John's College, Oxford (1975–8) and Fellow of Pembroke College, Oxford University (1979–89). He was professor of physics at the University of Sydney (1989–2003), and research director of the Australian Key Centre for Microscopy & Microanalysis
(1995–2001).

He is Supernumerary Fellow of Pembroke College Oxford. He has been JSPS Fellow at Institute of Industrial Science, Tokyo University (Japan),

TU-Delft
(Netherlands), Carl Zeiss Visiting professor at University of Jena (Germany), visiting professor at Warsaw University of Technology (Poland) and Lyle Fellow at University of Melbourne (Australia).

He has served as vice-president of the

editor of Advances in Optical & Electron Microscopy (Academic Press).[5]

Awards and honors

He has received several awards for his research, including an Alexander von Humboldt Research Award (at the Max Planck Institute for the Science of Light, Erlangen (Germany)), the Institute of Physics Optics and Photonics Division Prize, National Physical Laboratory Metrology Award, British Technology Group Academic Enterprise Award, Institution of Electrical Engineers Gyr and Landis Prize, and a commendation in the Prince of Wales Award for Industrial Innovation & Production.

References

  1. ^ Sheppard, Colin (1973). A reflection scanning electron diffractometer and its application to the oxidation of metals (PhD).
    OCLC 258528923
    .
  2. ^ https://www.mathgenealogy.org/id.php?id=130256
  3. ^ "Faculty of Engineering: Division of Bioengineering". National University of Singapore. Retrieved 13 February 2011.
  4. MIT
    .
  5. doi:10.1088/0963-9659/4/5/018
    .
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