List of materials analysis methods

This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.

Symbols

• μSR – see muon spin spectroscopy
• χ – see magnetic susceptibility

A

• AAS – Atomic absorption spectroscopy
• AED –
  Auger electron diffraction
• AES – Auger electron spectroscopy
• AFM –
  Atomic force microscopy
• AFS –
  Atomic fluorescence spectroscopy
• Analytical ultracentrifugation
• APFIM –
  Atom probe field ion microscopy
• APS –
  Appearance potential spectroscopy
• ARPES –
  Angle resolved photoemission spectroscopy
• ARUPS –
  Angle resolved ultraviolet photoemission spectroscopy
• ATR – Attenuated total reflectance

B

• BET – BET surface area measurement (BET from Brunauer, Emmett, Teller)
• BiFC – Bimolecular fluorescence complementation
• BKD – Backscatter Kikuchi diffraction, see
  EBSD
• BRET –
  Bioluminescence resonance energy transfer
• BSED – Back scattered electron diffraction, see
  EBSD

C

• CAICISS – Coaxial impact collision ion scattering spectroscopy
• CARS – Coherent anti-Stokes Raman spectroscopy
• CBED – Convergent beam electron diffraction
• CCM –
  Charge collection microscopy
• CDI – Coherent diffraction imaging
• CE – Capillary electrophoresis
• CET –
  Cryo-electron tomography
• CL – Cathodoluminescence
• CLSM –
  Confocal laser scanning microscopy
• COSY –
  Correlation spectroscopy
• Cryo-EM –
  Cryo-electron microscopy
• Cryo-SEM –
  Cryo-scanning electron microscopy
• CV – Cyclic voltammetry

D

• DE(T)A – Dielectric thermal analysis
• dHvA –
  De Haas–van Alphen effect
• DIC – Differential interference contrast microscopy
• Dielectric spectroscopy
• DLS – Dynamic light scattering
• DLTS – Deep-level transient spectroscopy
• DMA – Dynamic mechanical analysis
• DPI –
  Dual polarisation interferometry
• DRS – Diffuse reflection spectroscopy
• DSC – Differential scanning calorimetry
• DTA – Differential thermal analysis
• DVS –
  Dynamic vapour sorption

E

• EBIC –
  Electron beam induced current
  (see IBIC: ion beam induced charge)
• EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS)
• EBSD – Electron backscatter diffraction
• ECOSY – Exclusive correlation spectroscopy
• ECT – Electrical capacitance tomography
• EDAX –
  Energy-dispersive analysis of x-rays
• EDMR – Electrically detected magnetic resonance, see ESR or EPR
• EDS or EDX –
  Energy dispersive X-ray spectroscopy
• EELS – Electron energy loss spectroscopy
• EFTEM – Energy filtered transmission electron microscopy
• EID – Electron induced desorption
• EIT and ERT – Electrical impedance tomography and electrical resistivity tomography
• EL – Electroluminescence
• Electron crystallography
• ELS – Electrophoretic light scattering
• ENDOR – Electron nuclear double resonance, see ESR or EPR
• EPMA – Electron probe microanalysis
• EPR – Electron paramagnetic resonance spectroscopy
• ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis
• ESCA –
  Electron spectroscopy for chemical analysis see XPS
• ESD – Electron stimulated desorption
• ESEM – Environmental scanning electron microscopy
• ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry
• ESR – Electron spin resonance spectroscopy
• ESTM – Electrochemical scanning tunneling microscopy
• EXAFS – Extended X-ray absorption fine structure
• EXSY – Exchange spectroscopy

F

• FCS – Fluorescence correlation spectroscopy
• FCCS – Fluorescence cross-correlation spectroscopy
• FEM –
  Field emission microscopy
• FIB – Focused ion beam microscopy
• FIM-AP –
  Field ion microscopy–atom probe
• Flow birefringence
• Fluorescence anisotropy
• FLIM –
  Fluorescence lifetime imaging
• Fluorescence microscopy
• FOSPM –
  Feature-oriented scanning probe microscopy
• FRET –
  Fluorescence resonance energy transfer
• FRS – Forward Recoil Spectrometry, a synonym of ERD
• FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry
• FTIR – Fourier-transform infrared spectroscopy

G

• GC-MS –
  Gas chromatography-mass spectrometry
• GDMS – Glow discharge mass spectrometry
• GDOS –
  Glow discharge optical spectroscopy
• GISAXS –
  Grazing incidence small angle X-ray scattering
• GIXD –
  Grazing incidence X-ray diffraction
• GIXR –
  Grazing incidence X-ray reflectivity
• GLC –
  Gas-liquid chromatography

H

• HAADF – High angle annular dark-field imaging
• HAS – Helium atom scattering
• HPLC –
  High performance liquid chromatography
• HREELS – High resolution electron energy loss spectroscopy
• HREM – High-resolution electron microscopy
• HRTEM – High-resolution transmission electron microscopy
• HI-ERDA – Heavy-ion elastic recoil detection analysis
• HE-PIXE – High-energy proton induced X-ray emission

I

• IAES –
  Ion induced Auger electron spectroscopy
• IBA – Ion beam analysis
• IBIC – Ion beam induced charge microscopy
• ICP-AES – Inductively coupled plasma atomic emission spectroscopy
• ICP-MS – Inductively coupled plasma mass spectrometry
• Immunofluorescence
• ICR – Ion cyclotron resonance
• IETS – Inelastic electron tunneling spectroscopy
• IGA –
  Intelligent gravimetric analysis
• IGF – Inert gas fusion
• IIX – Ion induced X-ray analysis, see
  particle induced X-ray emission
• INS – Ion neutralization spectroscopy
• Inelastic neutron scattering
• IRNDT – Infrared non-destructive testing of materials
• IRS – Infrared spectroscopy
• ISS – Ion scattering spectroscopy
• ITC – Isothermal titration calorimetry
• IVEM –
  Intermediate voltage electron microscopy

L

• LALLS – Low-angle laser light scattering
• LC-MS –
  Liquid chromatography-mass spectrometry
• LEED – Low-energy electron diffraction
• LEEM – Low-energy electron microscopy
• LEIS – Low-energy ion scattering
• LIBS –
  Laser induced breakdown spectroscopy
• LOES – Laser optical emission spectroscopy
• LS – Light (Raman) scattering

M

• MALDI – Matrix-assisted laser desorption/ionization
• MBE –
  Molecular beam epitaxy
• MEIS – Medium energy ion scattering
• MFM –
  Magnetic force microscopy
• MIT – Magnetic induction tomography
• MPM –
  Multiphoton fluorescence microscopy
• MRFM – Magnetic resonance force microscopy
• MRI – Magnetic resonance imaging
• MS – Mass spectrometry
• MS/MS – Tandem mass spectrometry
• MSGE – Mechanically stimulated gas emission
• Mössbauer spectroscopy
• MTA – Microthermal analysis

N

• NAA – Neutron activation analysis
• ND – Neutron diffraction
• NDP – Neutron depth profiling
• NEXAFS –
  Near edge X-ray absorption fine structure
• NIS – Nuclear inelastic scattering/absorption
• NMR –
  Nuclear magnetic resonance spectroscopy
• NOESY –
  Nuclear Overhauser effect spectroscopy
• NRA – Nuclear reaction analysis
• NSOM – Near-field optical microscopy

O

• OBIC –
  Optical beam induced current
• ODNMR – Optically detected magnetic resonance, see ESR or EPR
• OES –
  Optical emission spectroscopy
• Osmometry

P

• PAS – Positron annihilation spectroscopy
• Photoacoustic spectroscopy
• PAT or PACT –
  Photoacoustic tomography
  or photoacoustic computed tomography
• PAX – Photoemission of adsorbed xenon
• PC or PCS –
  Photocurrent spectroscopy
• Phase contrast microscopy
• PhD – Photoelectron diffraction
• PD – Photodesorption
• PDEIS – Potentiodynamic electrochemical impedance spectroscopy
• PDS –
  Photothermal deflection spectroscopy
• PED – Photoelectron diffraction
• PEELS – parallel electron energy loss spectroscopy
• PEEM – Photoemission electron microscopy (or photoelectron emission microscopy)
• PES –
  Photoelectron spectroscopy
• PINEM – photon-induced near-field electron microscopy
• PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis
• PIXE –
  Particle (or proton) induced X-ray spectroscopy
• PL – Photoluminescence
• Porosimetry
• Powder diffraction
• PTMS – Photothermal microspectroscopy
• PTS – Photothermal spectroscopy

Q

• QENS – Quasielastic neutron scattering
• QCM-D – Quartz crystal microbalance with dissipation monitoring

R

• Raman spectroscopy
• RAXRS –
  Resonant anomalous X-ray scattering
• RBS –
  Rutherford backscattering spectrometry
• REM –
  Reflection electron microscopy
• RDS – Reflectance difference spectroscopy
• RHEED –
  Reflection high energy electron diffraction
• RIMS –
  Resonance ionization mass spectrometry
• RIXS – Resonant inelastic X-ray scattering
• RR spectroscopy – Resonance Raman spectroscopy

S

• SAD – Selected area diffraction
• SAED – Selected area electron diffraction
• SAM – Scanning Auger microscopy
• SANS –
  Small angle neutron scattering
• SAXS –
  Small angle X-ray scattering
• SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation
• SCEM – Scanning confocal electron microscopy
• SE – Spectroscopic ellipsometry
• SEC –
  Size exclusion chromatography
• SEIRA – Surface enhanced infrared absorption spectroscopy
• SEM – Scanning electron microscopy
• SERS –
  Surface enhanced Raman spectroscopy
• SERRS – Surface enhanced resonance Raman spectroscopy
• SESANS –
  Spin Echo Small Angle Neutron Scattering
• SEXAFS –
  Surface extended X-ray absorption fine structure
• SICM – Scanning ion-conductance microscopy
• SIL – Solid immersion lens
• SIM – Solid immersion mirror
• SIMS – Secondary ion mass spectrometry
• SNMS – Sputtered neutral species mass spectrometry
• SNOM –
  Scanning near-field optical microscopy
• SPECT – Single-photon emission computed tomography
• SPM – Scanning probe microscopy
• SRM-CE/MS – Selected-reaction-monitoring
  mass-spectrometry
• SSNMR – Solid-state nuclear magnetic resonance
• Stark spectroscopy
• STED –
  Stimulated emission depletion microscopy
• STEM – Scanning transmission electron microscopy
• STM – Scanning tunneling microscopy
• STS – Scanning tunneling spectroscopy
• SXRD – Surface X-ray diffraction

T

• TAT or TACT –
  photoacoustic tomography
  – PAT)
• TEM – Transmission electron microscopy
• TGA – Thermogravimetric analysis
• TIKA – Transmitting ion kinetic analysis
• TIMS – Thermal ionization mass spectrometry
• TIRFM –
  Total internal reflection fluorescence microscopy
• TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy
• TMA – Thermomechanical analysis
• TOF-MS – Time-of-flight mass spectrometry
• Two-photon excitation microscopy
• TXRF – Total reflection X-ray fluorescence analysis

U

• Ultrasound attenuation spectroscopy
• UPS – UV-photoelectron spectroscopy
• USANS – Ultra small-angle neutron scattering
• USAXS – Ultra small-angle X-ray scattering
• UT – Ultrasonic testing
• UV-Vis – Ultraviolet–visible spectroscopy

V

• VEDIC – Video-enhanced differential interference contrast microscopy
• Voltammetry

W

• WAXS –
  Wide angle X-ray scattering
• WDX or WDS –
  Wavelength dispersive X-ray spectroscopy

X

• XAES –
  X-ray induced Auger electron spectroscopy
• XANES –
  NEXAFS (near edge X-ray absorption fine structure)
• XAS – X-ray absorption spectroscopy
• X-CTR – X-ray crystal truncation rod scattering
• X-ray crystallography
• XDS –
  X-ray diffuse scattering
• XPEEM –
  X-ray photoelectron emission microscopy
• XPS – X-ray photoelectron spectroscopy
• XRD –
  X-ray diffraction
• XRES – X-ray resonant exchange scattering
• XRF – X-ray fluorescence analysis
• XRR – X-ray reflectivity
• XRS – X-ray Raman scattering
• XSW – X-ray standing wave technique

See also

• Characterization (materials science)

References

• Callister, WD (2000). Materials Science and Engineering – An Introduction. London: John Wiley and Sons.
  ISBN 0-471-32013-7
  .
• Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press.
  ISBN 978-0-521-83199-4
  .