Quantum metrology
Quantum metrology is the study of making high-resolution and highly sensitive measurements of physical parameters using quantum theory to describe the physical systems,[1][2][3][4][5][6] particularly exploiting quantum entanglement and quantum squeezing. This field promises to develop measurement techniques that give better precision than the same measurement performed in a classical framework. Together with quantum hypothesis testing,[7][8] it represents an important theoretical model at the basis of quantum sensing.[9][10]
Mathematical foundations
A basic task of quantum metrology is estimating the parameter of the unitary dynamics
where is the initial state of the system and is the Hamiltonian of the system. is estimated based on measurements on
Typically, the system is composed of many particles, and the Hamiltonian is a sum of single-particle terms
where acts on the kth particle. In this case, there is no interaction between the particles, and we talk about linear interferometers.
The achievable precision is bounded from below by the
where is the number of independent repetitions and is the quantum Fisher information.[1][11]
Examples
One example of note is the use of the
Applications
This section needs to be updated. The reason given is: Advanced LIGO has already deployed measurements with quantum squeezing..(October 2022) |
An important application of particular note is the detection of
Scaling and the effect of noise
A central question of quantum metrology is how the precision, i.e., the variance of the parameter estimation, scales with the number of particles. Classical interferometers cannot overcome the shot-noise limit. This limit is also frequently called standard quantum limit (SQL)
where is the number of particles. Shot-noise limit is known to be asymptotically achievable using coherent states and homodyne detection.[14]
Quantum metrology can reach the
However, if uncorrelated local noise is present, then for large particle numbers the scaling of the precision returns to shot-noise scaling [15][16]
Relation to quantum information science
There are strong links between quantum metrology and quantum information science. It has been shown that quantum entanglement is needed to outperform classical interferometry in magnetrometry with a fully polarized ensemble of spins.[17] It has been proved that a similar relation is generally valid for any linear interferometer, independent of the details of the scheme.[18] Moreover, higher and higher levels of multipartite entanglement is needed to achieve a better and better accuracy in parameter estimation.[19][20] Additionally, entanglement in multiple degrees of freedom of quantum systems (known as "hyperentanglement"), can be used to enhance precision, with enhancement arising from entanglement in each degree of freedom.[21]
See also
- Dimensional metrology
- Forensic metrology
- Smart Metrology
- Time metrology
References
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- ^ Kapale, Kishor T.; Didomenico, Leo D.; Kok, Pieter; Dowling, Jonathan P. (July 18, 2005). "Quantum Interferometric Sensors" (PDF). The Old and New Concepts of Physics. 2 (3–4): 225–240.
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